Zobrazování magnetických domén metodou mikroskopie magnetických sil

Abstract

Diploma thesis is devoted to the measurement of magnetic domains by the Magnetic Force Microscope (MFM). Theoretical introduction includes two parts, where the first describes basic concepts and relationsips of magnetism, some magnetic properties of materials, domain structures and their changes in the magnetic field. The second part explains the principles of AFM / MFM microscopy, measurement modes, forces between a tip and a sample surface. The practical part includes analysis and demonstration of influence of important measurement parameters, such as the influence of the tip-sample distance in lift-mode, tip types, tip magnetization, the influence of the external magnetic field on the tip, the scanning speed. Subsequently, the behavior of the epitaxial layer of (YSmLuCa)3(FeGe)5O12 on the matrix of the gadolinium gallium garnet Gd3Ga5O12 in the in-plane and out-of-plane magnetic field is studied.