Využití metod SPM pro studium polymerních nanokompozitů s vrstevnatými materiály

Abstract

Dissertation thesis deals with the preparation and characterization of new conductive nanocomposites of polymer/layered material type. The main aim of the thesis is to use the atomic force microscopy (AFM) and the conductive atomic force microscopy (C-AFM) in the analysis of these nanocomposites, and to optimize the measurement conditions. Several types of conductive polymer materials were prepared, namely composite polypropylene/graphite and nanocomposites polyaniline/montmorillonite, polypyrrole/montmorillonite, and polypyrrole/ghassoul. The analyses were focused on changes in morphology and surface conductivity in dependence on the conditions of preparation and subsequent modifications, especially the calcination of nanocomposites containing conducting polymers which led to successful preparation of few-layer graphene. Even though the AFM and C-AFM were sometimes time-consuming, no special sample preparation and vacuum were needed to display 2D and 3D images of the surface and to obtain important information about its properties which have been used to understand the changes in the material during its preparation and subsequent modifications.