Matrix description of coherent and incoherent light reflection and transmission by anisotropic multilayer structures

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dc.contributor.authorPostava, Kamil
dc.contributor.authorYamaguchi, Tomuo
dc.contributor.authorKantor, Roman
dc.date.accessioned2006-11-03T07:56:37Z
dc.date.available2006-11-03T07:56:37Z
dc.date.issued2002
dc.description.abstractWe propose a matrix method for the description of light reflection and transmission by an anisotropic multilayer system consisting of thin and thick layers. A method based on partial-wave matrix summations is applicable in the field of reflection and transmission photometry and ellipsometry. In the case of a thin anisotropic film, the interference effects were described by use of a coherent summation of Jones matrices. Incoherent intensity summations for a thick weakly anisotropic layer were characterized by use of the coherency vector formalism. Observable quantities or Mueller matrix components were obtained from the matrix describing transformation of the coherence vectors.en
dc.identifier.citationApplied Optics. 2002, vol. 41, issue 13, p. 2521-2531.en
dc.identifier.doi10.1364/AO.41.002521
dc.identifier.issn0003-6935
dc.identifier.issn1539-4522
dc.identifier.locationNení ve fondu ÚKen
dc.identifier.urihttp://hdl.handle.net/10084/57720
dc.identifier.wos000175347500020
dc.language.isoenen
dc.publisherOptical Society of Americaen
dc.relation.ispartofseriesApplied Opticsen
dc.relation.urihttps://doi.org/10.1364/AO.41.002521en
dc.subjectand metrologyen
dc.subjectmeasurementen
dc.subjectinstrumentationen
dc.subjectellipsometryand polarimetryen
dc.subjectphysical opticsen
dc.subjectanisotropic media (crystal optics)en
dc.subjectbirefringenceen
dc.titleMatrix description of coherent and incoherent light reflection and transmission by anisotropic multilayer structuresen
dc.typearticleen

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