Method for increasing sensitivity of shear-force distance control for scanning near-field microscopy

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dc.contributor.authorKantor, Roman
dc.contributor.authorLesňák, Michal
dc.contributor.authorBerdunov, N.
dc.contributor.authorShvets, Igor V.
dc.date.accessioned2007-08-07T11:59:42Z
dc.date.available2007-08-07T11:59:42Z
dc.date.issued1999
dc.description.abstract-enScanning-near field optical microscopy requires a distance control mechanism. In most cases, it is based on the shear-force detection. In this paper we report how the performance of the shear-force detection based on the most common nonoptical approach, a Quartz tuning fork, can be improved. Our approach is based on exciting oscillations in just one arm of the fork, not two. This approach reduces the response time of the shear-force detection system. We also introduce an ultra-sensitive system with a long free fiber tip.en
dc.identifier.citationApplied Surface Science. 1999, vol. 144-145, p. 510-513.en
dc.identifier.doi10.1016/S0169-4332(98)00850-2
dc.identifier.issn0169-4332
dc.identifier.locationNení ve fondu ÚKen
dc.identifier.urihttp://hdl.handle.net/10084/61578
dc.identifier.wos000080552300102
dc.language.isoenen
dc.publisherNorth-Hollanden
dc.relation.ispartofseriesApplied Surface Scienceen
dc.relation.urihttp://dx.doi.org/10.1016/S0169-4332(98)00850-2en
dc.subjectshear-force distance controlen
dc.subjectscanning near-field miscroscopyen
dc.titleMethod for increasing sensitivity of shear-force distance control for scanning near-field microscopyen
dc.typearticleen

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