Analysis of nanostructured materials - Ph.D. course
| dc.contributor.author | Weiss, Zdeněk | |
| dc.contributor.author | Wyslych, Petr | |
| dc.contributor.author | Čapková, Pavla | |
| dc.contributor.author | Křístková, Monika | |
| dc.contributor.author | Havlová, Dagmar | |
| dc.date.accessioned | 2006-11-07T09:28:54Z | |
| dc.date.available | 2006-11-07T09:28:54Z | |
| dc.date.issued | 2002 | |
| dc.description.abstract-en | The Ph.D. student course includes four areas oriented on analytical training in the field of nano-scale materials. The first one is focused on the computer modeling of nano-structured systems using the molecular simulation in Cerius2 modeling environment, the second deals with nanoscale surface analysis using Atomic Force Microscopy, and the third brings advanced information about crystal structure analysis using single-crystal and powder X-ray diffraction methods. The last area is oriented on analysis of materials by electron microscopy techniques. The Ph.D. student analytical course includes both theory and applications (training) of individual analytical procedures for various nano-structured materials (for example, nanotubes, intercalated and grafted clays, graphite, silicon wafers, polymer/clay nano-composites, and metalic thin multilayer materials). | en |
| dc.identifier.citation | International Conference on Engineering Education : ICEE 2001, Oslo/Bergen, Norway, August 6-10, 2001. Proceedings. 2002, p. 532-538. International journal of engineering education, vol. 18, no. 5. | en |
| dc.identifier.isbn | 1-588-74-091-9 | |
| dc.identifier.issn | 0949-149X | |
| dc.identifier.location | Není ve fondu ÚK | en |
| dc.identifier.uri | http://hdl.handle.net/10084/57851 | |
| dc.identifier.wos | 000179181200009 | |
| dc.language.iso | en | en |
| dc.publisher | Tempus | en |
| dc.relation.ispartofseries | International Conference on Engineering Education : ICEE 2001, Oslo/Bergen, Norway, August 6-10, 2001. Proceedings | en |
| dc.relation.uri | http://www.ineer.org/Events/ICEE2001/Proceedings/papers/479.pdf | en |
| dc.subject | atomic force microscopy | en |
| dc.subject | computer modeling | en |
| dc.subject | electron microscopy | en |
| dc.subject | Ph.D. student course | en |
| dc.subject | X-ray diffraction | en |
| dc.title | Analysis of nanostructured materials - Ph.D. course | en |
| dc.type | article | en |