Genetická syntéza difrakcného profilu
| dc.contributor.author | Jurečka, Stanislav | |
| dc.contributor.author | Havlík, Milan | |
| dc.contributor.author | Jurečková, Mária | |
| dc.date.accessioned | 2011-01-18T11:19:10Z | |
| dc.date.available | 2011-01-18T11:19:10Z | |
| dc.date.issued | 2004 | |
| dc.description.abstract-en | In this paper we describe theoretical synthesis of the x-ray diffraction line profile as a superposition of the spectral components Ka1 and Ka2 optimized to the experimental data by the genetic algorithm and nonlinear optimization methods 'Nelder-Mead downhill simplex' and Levenberg-Marquardt method. Such combination of global and local optimization methods results in a mathematical model of the diffraction profile, providing reliable determininig of diffraction line characteristics for the material structure properties study. Experimetal results of the optimization preocedures are given too. | en |
| dc.format.extent | 142650 bytes | cs |
| dc.format.mimetype | application/pdf | cs |
| dc.identifier.citation | Advances in electrical and electronic engineering. 2004, vol. 3, no. 1, p. 27-30. | en |
| dc.identifier.issn | 1336-1376 | |
| dc.identifier.uri | http://hdl.handle.net/10084/83641 | |
| dc.language.iso | sk | en |
| dc.publisher | Žilinská univerzita v Žiline. Elektrotechnická fakulta | en |
| dc.relation.ispartofseries | Advances in electrical and electronic engineering | en |
| dc.relation.uri | http://advances.utc.sk/index.php/AEEE | en |
| dc.rights | Creative Commons Attribution 3.0 Unported (CC BY 3.0) | en |
| dc.rights | © Žilinská univerzita v Žiline. Elektrotechnická fakulta | en |
| dc.rights.access | openAccess | |
| dc.rights.uri | http://creativecommons.org/licenses/by/3.0/ | en |
| dc.title | Genetická syntéza difrakcného profilu | en |
| dc.title.alternative | Genetic synthesis of the diffraction profile | en |
| dc.type | article | en |
| dc.type.status | Peer-reviewed | cs |
| dc.type.version | publishedVersion | cs |