Characterization of special anisotropic structures using Mueller matrix ellipsometry

Abstract

This bachelor thesis is focused on the developement and extension of the Mueller matrix spectroscopic ellipsometry measurement techniques. A novel method of optical activity measurement was developed and specific rotatory powers of the saccharides solutions were calculated exclusively over spectral range of 400--900~nm. Lu-Chipman decomposition of according experimental Mueller matrix was conducted to confirm the corectness of the method. Particular emphasis was placed on the growth of sucrose monocrystal and butanedioic acid cocrystals using slow evaporation method. Good-quality monoctystals were grown as was verifyed using polarization microscopy. For the purpose of future research, pyrite and cassiterite minerals were measured ellipsometrically, and their dielectric tensor spectra were determined using Kramers-Kronig consistent models. The one of this thesis goals is also to characterize the diffraction structures. We rearrange the standard Woollam RC2 ellipsometer reflection configuration used for the measurements, to acquire the possibility of extended and automated characterization of blazed diffraction gratings, in order to calculate the diffraction efficiencies of these diffraction structures.