On nanometer ordering in thin amorphous hydrogenated silicon

dc.contributor.authorMüllerová, Jarmila
dc.contributor.authorVavruňková, Veronika
dc.contributor.authorŠutta, P.
dc.date.accessioned2011-02-10T07:52:35Z
dc.date.available2011-02-10T07:52:35Z
dc.date.issued2008
dc.description.abstractWe investigated thin films of amorphous hydrogenated silicon (a-Si:H) deposited by PECVD under increasing dilutions of silane plasma by hydrogen. We found out that under increasing additional hydrogen at the depositions, thin films obtain less hydrogen bonded to silicon. The optical band gap energies determined from UV Vis transmittance and reflectance spectra were found to be increasing function of the dilution. We deduce that optical band gaps expanse due to the decreasing dimensions of silicon nanocrystals. They were calculated to be of 2 – 4 nm which proves the medium-range order in a-Si:H.en
dc.format.extent185736 bytescs
dc.format.mimetypeapplication/pdfcs
dc.identifier.citationAdvances in electrical and electronic engineering. 2008, vol. 7, no. 1, 2, p. 369-372.en
dc.identifier.issn1336-1376
dc.identifier.urihttp://hdl.handle.net/10084/84214
dc.language.isoenen
dc.publisherŽilinská univerzita v Žiline. Elektrotechnická fakultaen
dc.relation.ispartofseriesAdvances in electrical and electronic engineeringen
dc.relation.urihttp://advances.utc.sk/index.php/AEEEen
dc.rightsCreative Commons Attribution 3.0 Unported (CC BY 3.0)
dc.rights© Žilinská univerzita v Žiline. Elektrotechnická fakulta
dc.rights.accessopenAccess
dc.rights.urihttp://creativecommons.org/licenses/by/3.0/
dc.titleOn nanometer ordering in thin amorphous hydrogenated siliconen
dc.typearticleen
dc.type.statusPeer-reviewedcs
dc.type.versionpublishedVersioncs

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