A Study of Ensemble Models for Defect Prediction from Class Diagram

dc.contributor.authorBattulga, Batnyam
dc.contributor.authorTsoodol, Lkhamrolom
dc.contributor.authorErdenebaatar, Bilguu
dc.contributor.authorErdenebaatar, Tsetsegjarg
dc.contributor.authorNamsrai, Oyun-Erdene
dc.contributor.authorBold, Naranchimeg
dc.date.accessioned2026-07-17T06:23:30Z
dc.date.available2026-07-17T06:23:30Z
dc.date.issued2026
dc.description.abstractSoftware defect prediction in the early stages of the Software Development Life Cycle (SDLC) is crucial to reducing project cost and ensuring the implementation’s success. Existing methods for software defect detection in a project rely on the implementation or testing phases of the SDLC, based on the source code. While relatively few studies have focused on identifying defects in the design phase of the SDLC, these approaches primarily employ machine learning or deep learning methods to detect and classify suspect code segments or classes in static diagrams as defective or clean. This study utilizes 24 model-based metrics extracted via SDMetrics, including structural and objectoriented design features derived from UML class diagrams. To enhance classification performance, this study introduces an ensemble machine learning model with different techniques (stacking, voting) that combine multiple machine learning models. Specifically, we compare ensemble models with different ensemble techniques to the individual models in terms of accuracy, precision, recall, F-measure, and AUC by utilizing a large dataset called the Unified Bug Dataset, comprising five publicly available sub-datasets. Experimental results show that the ensemble model with the stacking ensemble method outperformed other ensemble models and the individual classifiers (RF, XGBoost, ET) in terms of AUC.
dc.identifier.citationAdvances in electrical and electronic engineering. 2026, vol. 24, no. 2, pp. 91 – 99 : ill.
dc.identifier.doi10.15598/aeee.v24i2.250605
dc.identifier.issn1336-1376
dc.identifier.issn1804-3119
dc.identifier.urihttp://hdl.handle.net/10084/158802
dc.language.isoen
dc.publisherVysoká škola báňská - Technická univerzita Ostrava
dc.relation.ispartofseriesAdvances in electrical and electronic engineering
dc.relation.urihttps://doi.org/10.15598/aeee.v24i2.250605
dc.rights© Vysoká škola báňská - Technická univerzita Ostrava
dc.rightsAttribution-NoDerivatives 4.0 Internationalen
dc.rights.accessopenAccess
dc.rights.urihttp://creativecommons.org/licenses/by-nd/4.0/
dc.subjectensemble machine learning model
dc.subjectdesign defect prediction
dc.subjectmachine learning
dc.subjectclass diagram
dc.subjectdesign metrics
dc.titleA Study of Ensemble Models for Defect Prediction from Class Diagram
dc.typearticle
dc.type.statusPeer-reviewed
dc.type.versionpublishedVersion
local.files.count1
local.files.size1832969
local.has.filesyes

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