Magneto-optical ellipsometry of systems containing thick layers

Abstract

A recurrent matrix method for description and modeling of light reflection and transmission by an anisotropic multilayer system consisting of thin and thick magneto-optic (MO) layers is proposed. Light interference in thin MO film is described by an amplitude-based Jones matrix formalism. For description of intensity summation in thick MO layers we propose using 4×4 coherence transforming matrices relating coherence vectors. The MO ellipsometry angles rotation and ellipticity are expressed in terms of the matrix components. Effects of partial coherence to reflection and transmission ellipsometry are discussed. Simplification of the general formalism is presented for the normal incidence polar MO geometry.