Dispersive white-light spectral interferometry including the effect of thin-film for distance measurement
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Publisher
Urban & Fischer
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Ve fondu ÚK
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Abstract
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Subject(s)
white light, spectral interferometry, thin-film structure, nonlinear phase function, distance
Citation
Optik - International Journal for Light and Electron Optics. 2007, vol. 118, issue 7, p. 319-324.