Kontrola spolehlivosti digitálních radiotechnických systémů
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Date issued
Authors
Ganiyev, Artem
Journal Title
Journal ISSN
Volume Title
Publisher
Vysoká škola báňská - Technická univerzita Ostrava
Location
ÚK/Sklad diplomových prací
Signature
200903520
Abstract
This thesis appertains to compile methodics, relating to ratings of faultless functioning of large scale integration circuits (LSI) and very large scale integration circuits (VLSI). In the thesis there is a comparation analysis of factors determining faultless of an integrated circuits, analysis of already existing methods and model for rating the faultless function of LSI and VLSI and also there is an algorithm and program for analysis of fault rate in LSI and VLSI circuits.
Description
Subject(s)
integrated circuit, telecomunication system., analogue-digital converter, diagnostics and uninterrupted checks, computational system, program equipment, still memory device, operative memory device, memory divide, memory component, very large scale integration circuits, Large scale integration circuits