Study of optical anisotropic systems using Mueller matrix spectroscopy.

Abstract

This bachelor thesis is focused on Mueller matrix ellipsometry, mostly of anisotropic systems. In the first part there are solved Maxwell equations for homogeneous anisotropic systems by Yeh and Berreman approach. The second part consists of application of these approaches on isotropic crystal Si with SiO2 layer. The main part of this thesis is modeling of optical response of anisotropic crystal, respectively rutile, its optical characterization, determination of optical functions and separation of systematic errors in measured data.