dc.contributor.author | Gryglewicz, Jacek | |
dc.contributor.author | Macherzyński, Wojciech | |
dc.contributor.author | Stafiniak, Andrzej | |
dc.contributor.author | Paszkiewicz, Bogdan | |
dc.contributor.author | Paszkiewicz, Regina | |
dc.date.accessioned | 2017-01-11T09:13:08Z | |
dc.date.available | 2017-01-11T09:13:08Z | |
dc.date.issued | 2016 | |
dc.identifier.citation | Advances in electrical and electronic engineering. 2016, vol. 14, no. 2, p. 218-222 : ill. | cs |
dc.identifier.issn | 1336-1376 | |
dc.identifier.issn | 1804-3119 | |
dc.identifier.uri | http://hdl.handle.net/10084/116590 | |
dc.description.abstract | Significant improvement of Ti/Al/Mo/Au ohmic contacts deposited on previously Cl2/BCl3/Ar plasma treated surface was observed. The standard deviation of contact resistance was crucially reduced due to the incorporation of Cl2/BCl3/Ar plasma treatment. The Cl2:BCl3:Ar gas mixture was used in order to thin the top of AlGaN layer prior to deposition of Ti/Al/Mo/Au ohmic contacts. The surface morphology of AlGaN was investigated using scanning electron microscopy and atomic force microscopy. TLM measurements revealed a consequential decrease of contact resistivity. | cs |
dc.format.extent | 650666 bytes | |
dc.format.mimetype | application/pdf | |
dc.language.iso | en | cs |
dc.publisher | Vysoká škola báňská - Technická univerzita Ostrava | cs |
dc.relation.ispartofseries | Advances in electrical and electronic engineering | cs |
dc.relation.uri | http://dx.doi.org/10.15598/aeee.v14i2.1589 | cs |
dc.rights | © Vysoká škola báňská - Technická univerzita Ostrava | |
dc.rights | Creative Commons Attribution 3.0 Unported (CC BY 3.0) | |
dc.rights.uri | http://creativecommons.org/licenses/by/4.0/ | |
dc.subject | AlGaN | cs |
dc.subject | GaN | cs |
dc.subject | ohmic metallization | cs |
dc.subject | recess | cs |
dc.subject | Ti/Al/Mo/Au | cs |
dc.title | Application of Cl2/BCl3/Ar plasma treatment in the improvement of Ti/Al/Mo/Au ohmic contacts | cs |
dc.type | article | cs |
dc.identifier.doi | 10.15598/aeee.v14i2.1589 | |
dc.rights.access | openAccess | |
dc.type.version | publishedVersion | cs |
dc.type.status | Peer-reviewed | cs |