dc.contributor.author | Doorsamy, Wesley | |
dc.contributor.author | Bokoro, Pitshou | |
dc.date.accessioned | 2018-11-06T13:16:03Z | |
dc.date.available | 2018-11-06T13:16:03Z | |
dc.date.issued | 2018 | |
dc.identifier.citation | Advances in electrical and electronic engineering. 2018, vol. 16, no. 3, p. 311-317 : ill. | cs |
dc.identifier.issn | 1336-1376 | |
dc.identifier.issn | 1804-3119 | |
dc.identifier.uri | http://hdl.handle.net/10084/132815 | |
dc.description.abstract | Innovative test methods for circuit breakers are constantly sought after to reduce maintenance time and costs, yet still provide accurate assessment of this critical substation equipment. This paper proposes a novel method for response modelling of high voltage SF6 circuit breakers, based on artificial neural networks, to provide a means of assessing its condition. The proposed method enables a timing response model of the circuit breaker to be developed using trip command parameters. In this paper, an experimental setup is used to perform trip response testing of a three-phase 75 kV circuit breaker. The obtained data is then used to train, validate and test a Bayesian regularised artificial neural network that can predict response times of the breaker for a given set of trip command parameters. | cs |
dc.format.extent | 713970 bytes | |
dc.format.mimetype | application/pdf | |
dc.language.iso | en | cs |
dc.publisher | Vysoká škola báňská - Technická univerzita Ostrava | cs |
dc.relation.ispartofseries | Advances in electrical and electronic engineering | cs |
dc.relation.uri | http://dx.doi.org/10.15598/aeee.v16i3.2845 | cs |
dc.rights | © Vysoká škola báňská - Technická univerzita Ostrava | |
dc.rights | Attribution-NoDerivatives 4.0 International | * |
dc.rights.uri | http://creativecommons.org/licenses/by-nd/4.0/ | * |
dc.subject | circuit breaker | cs |
dc.subject | condition assessment | cs |
dc.subject | neural network | cs |
dc.subject | response model | cs |
dc.title | A neural network based response model for high voltage circuit-breaker testing | cs |
dc.type | article | cs |
dc.identifier.doi | 10.15598/aeee.v16i3.2845 | |
dc.rights.access | openAccess | cs |
dc.type.version | publishedVersion | cs |
dc.type.status | Peer-reviewed | cs |