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dc.contributor.authorGupta, Neeraj
dc.contributor.authorKumar, Prashant
dc.date.accessioned2021-04-29T04:51:04Z
dc.date.available2021-04-29T04:51:04Z
dc.date.issued2021
dc.identifier.citationAdvances in electrical and electronic engineering. 2021, vol. 19, no. 1, p. 66 - 73 : ill.cs
dc.identifier.issn1336-1376
dc.identifier.issn1804-3119
dc.identifier.urihttp://hdl.handle.net/10084/143052
dc.description.abstractThis paper presents an analytical model for intrinsic short-circuit admittance (Y) parameters of DH-DD-TM-SG MOSFET. Y parameters have been modeled using different small-signal equivalent circuit parameter which is used to find the Scattering parameters. These Y parameters have further been employed for computing S-parameters. These parameters are further used to investigate the microwave performance parameters of the proposed device. The Unilateral Power Gain and the maximum oscillation frequency is determined to evaluatethe microwave performance. The proposed device shows a higher cut-off frequency (f_T) and maximum oscillation frequency as to TM-SG MOSFET. The proposed device exhibits a 4.2% improvement in U_T 2.81% in G_ms and 6.9% improvement in G_MTPG as compared to TMSG. The analytical result of DH-DD-TM-SG MOSFET is in accordance with the simulated results.cs
dc.language.isoencs
dc.publisherVysoká škola báňská - Technická univerzita Ostravacs
dc.relation.ispartofseriesAdvances in electrical and electronic engineeringcs
dc.relation.urihttps://doi.org/10.15598/aeee.v19i1.3788cs
dc.rights© Vysoká škola báňská - Technická univerzita Ostrava
dc.rightsAttribution-NoDerivatives 4.0 International*
dc.rights.urihttp://creativecommons.org/licenses/by-nd/4.0/*
dc.subjectadmittance parametercs
dc.subjectcut-off frequencycs
dc.subjecthalo implantationcs
dc.subjectscattering parametercs
dc.subjecttriple materialcs
dc.titleElicitation of Scattering Parameters of Dual-halo Dual-dielectric Triple-material Surrounding Gate (DH-DD-TM-SG) MOSFET for Microwave Frequency Applicationscs
dc.typearticlecs
dc.identifier.doi10.15598/aeee.v19i1.3788
dc.rights.accessopenAccesscs
dc.type.versionpublishedVersioncs
dc.type.statusPeer-reviewedcs


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Zobrazit minimální záznam

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