Method for increasing sensitivity of shear-force distance control for scanning near-field microscopy

dc.contributor.author	Kantor, Roman
dc.contributor.author	Lesňák, Michal
dc.contributor.author	Berdunov, N.
dc.contributor.author	Shvets, Igor V.
dc.date.accessioned	2007-08-07T11:59:42Z
dc.date.available	2007-08-07T11:59:42Z
dc.date.issued	1999
dc.identifier.citation	Applied Surface Science. 1999, vol. 144-145, p. 510-513.	en
dc.identifier.issn	0169-4332
dc.identifier.uri	http://hdl.handle.net/10084/61578
dc.language.iso	en	en
dc.publisher	North-Holland	en
dc.relation.ispartofseries	Applied Surface Science	en
dc.relation.uri	http://dx.doi.org/10.1016/S0169-4332(98)00850-2	en
dc.subject	shear-force distance control	en
dc.subject	scanning near-field miscroscopy	en
dc.title	Method for increasing sensitivity of shear-force distance control for scanning near-field microscopy	en
dc.type	article	en
dc.identifier.location	Není ve fondu ÚK	en
dc.description.abstract-en	Scanning-near field optical microscopy requires a distance control mechanism. In most cases, it is based on the shear-force detection. In this paper we report how the performance of the shear-force detection based on the most common nonoptical approach, a Quartz tuning fork, can be improved. Our approach is based on exciting oscillations in just one arm of the fork, not two. This approach reduces the response time of the shear-force detection system. We also introduce an ultra-sensitive system with a long free fiber tip.	en
dc.identifier.doi	10.1016/S0169-4332(98)00850-2
dc.identifier.wos	000080552300102

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