dc.contributor.author | Jackuliak, Quido | |
dc.contributor.author | Šutta, Pavol | |
dc.date.accessioned | 2011-01-14T13:12:35Z | |
dc.date.available | 2011-01-14T13:12:35Z | |
dc.date.issued | 2003 | |
dc.identifier.citation | Advances in electrical and electronic engineering. 2003, vol. 2, no. 2, p. 20-25. | en |
dc.identifier.issn | 1336-1376 | |
dc.identifier.uri | http://hdl.handle.net/10084/83613 | |
dc.format.extent | 442567 bytes | cs |
dc.format.mimetype | application/pdf | cs |
dc.language.iso | sk | en |
dc.publisher | Žilinská univerzita v Žiline. Elektrotechnická fakulta | en |
dc.relation.ispartofseries | Advances in electrical and electronic engineering | en |
dc.relation.uri | http://advances.utc.sk/index.php/AEEE | en |
dc.rights | Creative Commons Attribution 3.0 Unported (CC BY 3.0) | en |
dc.rights | © Žilinská univerzita v Žiline. Elektrotechnická fakulta | en |
dc.rights.uri | http://creativecommons.org/licenses/by/3.0/ | en |
dc.title | Makro a mikronapätia v polykryštalických tenkých vrstvách SI nanesených na keramické podložky | en |
dc.title.alternative | Lattce and micro-strains in polycrystalline silicon films deposited on ceramic substates | en |
dc.type | article | en |
dc.rights.access | openAccess | |
dc.type.version | publishedVersion | cs |
dc.type.status | Peer-reviewed | cs |