Iterrative correction of measurement with averaging of dithered samples

dc.contributor.author	Kamenský, M.
dc.contributor.author	Kováč, K.
dc.date.accessioned	2011-02-09T14:50:16Z
dc.date.available	2011-02-09T14:50:16Z
dc.date.issued	2008
dc.identifier.citation	Advances in electrical and electronic engineering. 2008, vol. 7, no. 1, 2, p. 358-361.	en
dc.identifier.issn	1336-1376
dc.identifier.uri	http://hdl.handle.net/10084/84209
dc.description.abstract	Self-calibration techniques could eliminate measurement errors caused by time changes and component aging. For ADC performance enhancement also averaging is necessary. In the paper the iterative measurement error correction method is presented in combination with averaging. Dither theory for Gaussian noise has been used for exhibition of averaging abilities in ADC characteristic improvement. Experimental ENOB value improvement is more than 1.5 bit.	en
dc.format.extent	263466 bytes	cs
dc.format.mimetype	application/pdf	cs
dc.language.iso	en	en
dc.publisher	Žilinská univerzita v Žiline. Elektrotechnická fakulta	en
dc.relation.ispartofseries	Advances in electrical and electronic engineering	en
dc.relation.uri	http://advances.utc.sk/index.php/AEEE	en
dc.rights	Creative Commons Attribution 3.0 Unported (CC BY 3.0)
dc.rights	© Žilinská univerzita v Žiline. Elektrotechnická fakulta
dc.rights.uri	http://creativecommons.org/licenses/by/3.0/
dc.title	Iterrative correction of measurement with averaging of dithered samples	en
dc.type	article	en
dc.rights.access	openAccess
dc.type.version	publishedVersion	cs
dc.type.status	Peer-reviewed	cs

AEEE. 2008, vol. 7 [106]
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