dc.contributor.author | Flickyngerová, S. | |
dc.contributor.author | Řeháková, A. | |
dc.contributor.author | Tvarožek, V. | |
dc.contributor.author | Novotný, I. | |
dc.date.accessioned | 2011-02-10T08:05:23Z | |
dc.date.available | 2011-02-10T08:05:23Z | |
dc.date.issued | 2008 | |
dc.identifier.citation | Advances in electrical and electronic engineering. 2008, vol. 7, no. 1, 2, p. 382-384. | en |
dc.identifier.issn | 1336-1376 | |
dc.identifier.uri | http://hdl.handle.net/10084/84218 | |
dc.description.abstract | High transparent and conductive, aluminium - doped zinc oxide thin films (ZnO:Al), were prepared by radio –
frequency (RF) diode sputtering from ZnO+2 wt. % Al2O3 target on Eutal glass substrates. Surfaces of the samples were
treated by various technological steps during preparation. The ion bombardment and the substrate temperature modified their
structure, surface morphology, electrical and optical parameters. In this work we present changes between samples prepared
at room temperature (RT) and at 200°C, between samples on ion etched substrate and non-modified substrate, and effect of
ion etching of the sample surface. We measured transmittance, resistivity and microroughness by AFM on all samples. | en |
dc.format.extent | 1482860 bytes | cs |
dc.format.mimetype | application/pdf | cs |
dc.language.iso | en | en |
dc.publisher | Žilinská univerzita v Žiline. Elektrotechnická fakulta | en |
dc.relation.ispartofseries | Advances in electrical and electronic engineering | en |
dc.relation.uri | http://advances.utc.sk/index.php/AEEE | en |
dc.rights | Creative Commons Attribution 3.0 Unported (CC BY 3.0) | |
dc.rights | © Žilinská univerzita v Žiline. Elektrotechnická fakulta | |
dc.rights.uri | http://creativecommons.org/licenses/by/3.0/ | |
dc.title | Sputtered of ZnO:Al thin films for application in photovoltaic solar cells | en |
dc.type | article | en |
dc.rights.access | openAccess | |
dc.type.version | publishedVersion | cs |
dc.type.status | Peer-reviewed | cs |