Využití řádkovací elektronové mikroskopie pro charakteristiku struktury technických materiálů

Abstract

This thesis is focused on the use of scanning electron microscopy to characterize the structure of technical materials. In this Thesis, I have described several methods for studying the structure of materials using a scanning electron microscope and sample preparation for electron microscopy. There was also a practical part conducted in the conclusion of this Thesis which illustrates both graphically and in tables the diference between the main paging methods.