Calculated reflection coefficients of a single planar interface with an optically biaxial Cu(en)(H2O)(2)SO4 material compared to experiment
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American Scientific Publishers
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Abstract
In our previous work we presented ellipsometric measurement of (ratios of) reflection coefficients of a planar interface between air and a facet of a single-crystal monoclinic (i.e., anisotropic) material Cu(en)(H2O)(2)SO4, en = C2H8N2. The reported dependence of the coefficients on azimuthal orientation of the crystal, Figure 1 below, showed features which were ascribed to misalignment from the then-assumed ideal orientation. Here, using Berreman's formalism, we show on theoretical grounds that misalignment may truly result in the observed findings.
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reflection coefficients, biaxial material, Berreman's formalism
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Journal of Nanoscience and Nanotechnology. 2016, vol. 16, no. 8, p. 7818-7821.