Příprava polyanilinových vrstev na skle a jejich charakterizace pomocí mikroskopie atomárních sil

Abstract

This thesis describes the preparation of polyaniline (PANI) thin layers prepared on the glass substrate by in-situ polymerization of aniline by mixing two solutions and characterization of such prepared films by atomic force microscopy (AFM). Depending on the deposition time (i.e. the immersion of the glass slide in the reaction mixture), morphology, surface roughness and thickness of the formed layers were determined by AFM. Adhesion to gold and silicon was also measured. Using this microscopic technique the single steps of creating the PANI thin layers, i.e. growth and rounding of grains, filling gaps between them and the formation of a continuous film can be very well observed. Surface characterization of PANI layers as well as the determination of their adhesion, has a great influence on their further use and application.