Spektrální analýza dat z optického měření topografie povrchů materiálů

Abstract

This dissertation thesis is focused on two dimensional Fourier transform and possibilities of its use for analysis and evaluation of data acquired from measurement of surface topography. Principles of surface topography measurements are briefly described as well as methods used for processing of the topographical data which are currently included in technical standards. The main part of this thesis is dedicated to the two dimensional Fourier transformation, its properties and calculation methods. It also focuses on an overview of surface irregularities and its visualization in the two dimensional spectral maps. Theoretical assumptions were verified using practical measurements. The proposed method for automated evaluation of surface properties is based on the two dimensional Fourier spectral maps. It includes thresholding of spectral maps and evaluation of changes in the areas with low and high frequencies. The proposed methods were first tested on data acquired using professional optical profilometer and after that also using camera system designed for this purpose.