Analýza polovodičových pamětí pod vlivem ionizujícího záření v reálném čase

Abstract

The objective of this thesis is to research and then prove or disprove the influence of ionising radiation on various types of semiconductor memories. The issue of ionising radiation and FPGA technique is briefly described in theoretical part of thesis. The practical part is dedicated to design of hardware component for continuous analysis of memories content and following realization of PCB of designed component. The continuous analysis of memory content during radiation is realized by FPGA circuit logic.