Monitoring of the discharge process of bulk material in silos using electrical capacitance tomography

dc.contributor.authorŽurovec, David
dc.contributor.authorHlosta, Jakub
dc.contributor.authorRozbroj, Jiří
dc.contributor.authorNečas, Jan
dc.contributor.authorZegzulka, Jiří
dc.date.accessioned2018-09-11T06:29:30Z
dc.date.available2018-09-11T06:29:30Z
dc.date.issued2018
dc.description.abstractMonitoring the bulk material discharge from silos using electrical capacitance tomography (ECT) is an effective way to supervise dynamic flow profiles within silos. In this case, bulk materials such as wheat and corn are used. These materials are typical crops in the agricultural industry. The basic differences of these materials are shape and size. The material properties are the main factors influencing the optimal discharge processes. The ECT method is used to determine the flow profile during the discharge of each material from the silo. ECT is a non-destructive and contactless method for measuring the inner space of the silo. The results demonstrate that the monitoring of discharge processes from the silo by applying ECT is an innovative online monitoring method with a wide application.cs
dc.description.firstpage1559cs
dc.description.issue8cs
dc.description.lastpage1565cs
dc.description.sourceWeb of Sciencecs
dc.description.volume41cs
dc.identifier.citationChemical Engineering and Technology. 2018, vol. 41, issue 8, p. 1559-1565.cs
dc.identifier.doi10.1002/ceat.201700440
dc.identifier.issn0930-7516
dc.identifier.issn1521-4125
dc.identifier.urihttp://hdl.handle.net/10084/131652
dc.identifier.wos000439753700009
dc.language.isoencs
dc.publisherWileycs
dc.relation.ispartofseriesChemical Engineering & Technologycs
dc.relation.urihttps://doi.org/10.1002/ceat.201700440cs
dc.rights© 2018 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheimcs
dc.subjectdischarge processescs
dc.subjectdynamic flow profilescs
dc.subjectelectrical capacitance tomographycs
dc.titleMonitoring of the discharge process of bulk material in silos using electrical capacitance tomographycs
dc.typearticlecs
dc.type.statusPeer-reviewedcs

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