In-situ X-ray diffraction studies and magneto-optic Kerr effect on RF sputtered thin films of BaTiO3 and Co, Nb co-doped BaTiO3
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Siddheswaran, R.
Šutta, Pavol
Novák, Petr
Netrvalová, Marie
Hendrych, Aleš
Životský, Ondřej
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Elsevier
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Abstract
The effect of annealing on structural and magnetic properties of the RF sputtered BaTiO3 and Co, Nb co-doped BaTiO3 thin films on Si (001) substrates were studied. The structure of the as-deposited (amorphous) films was changed into cubic perovskite phase during the in-situ X-ray diffraction from room temperature to 900 °C. The enhancement of crystalline quality with respect to the increase of annealing temperature was observed by the in-situ XRD. The magnetic properties of the films before and after annealing were studied by the measurement of Magneto-Optic Kerr Effect (MOKE). The pure BaTiO3 revealed a paramagnetic behavior, whereas the Co and Nb co-doped BaTiO3 films exhibited room temperature ferromagnetism. The increase in ferromagnetic response was observed in the Co and Nb co-doped BaTiO3 films annealed at 900 °C rather than the as-deposited film.
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Subject(s)
BaTiO3, Thin film, RF sputtering, In-situ XRD, Magnetic properties
Citation
Ceramics International. 2016, vol. 42, issue 3, p. 3882-3887.