Experimental Analysis of Communitation Process of Power Semiconductor Transistor’s Structures
| dc.contributor.author | Špánik, Pavol | |
| dc.contributor.author | Dobrucký, Branislav | |
| dc.contributor.author | Frívaldský, Michal | |
| dc.contributor.author | Drgoňa, Peter | |
| dc.contributor.author | Lokšeninec, Ivan | |
| dc.date.accessioned | 2011-02-03T09:39:54Z | |
| dc.date.available | 2011-02-03T09:39:54Z | |
| dc.date.issued | 2007 | |
| dc.description.abstract | The paper deals with testing device designed for experimental examination of processes in power electronics devices during various switching modes is described. Through the use of auxiliary circuits additional switching modes (ZVS, ZCS) are realized except hard switching, and turning-off with reduced current respectively. The device´s advantage is possibility of fine dead time setting, allowing us analyzing the effects of phenomenon noted above, on measurements of commutation losses. | en |
| dc.format.extent | 174234 bytes | cs |
| dc.format.mimetype | application/pdf | cs |
| dc.identifier.citation | Advances in electrical and electronic engineering. 2007, vol. 6, no. 1, p. 50-53. | en |
| dc.identifier.issn | 1336-1376 | |
| dc.identifier.uri | http://hdl.handle.net/10084/83865 | |
| dc.language.iso | en | en |
| dc.publisher | Žilinská univerzita v Žiline. Elektrotechnická fakulta | en |
| dc.relation.ispartofseries | Advances in electrical and electronic engineering | en |
| dc.relation.uri | http://advances.utc.sk/index.php/AEEE | en |
| dc.rights | Creative Commons Attribution 3.0 Unported (CC BY 3.0) | |
| dc.rights | © Žilinská univerzita v Žiline. Elektrotechnická fakulta | |
| dc.rights.access | openAccess | |
| dc.rights.uri | http://creativecommons.org/licenses/by/3.0/ | |
| dc.title | Experimental Analysis of Communitation Process of Power Semiconductor Transistor’s Structures | en |
| dc.type | article | en |
| dc.type.status | Peer-reviewed | cs |
| dc.type.version | publishedVersion | cs |