Characterization of organic low-dielectric-constant materials using optical spectroscopy
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Publisher
Optical Society of America
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Není ve fondu ÚK
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Subject(s)
materials, organic materials, Spectroscopy, thin films, optical properties, physical optics, ellipsometry and polarimetry
Citation
Optics Express. 2001, vol. 9, issue 3, p. 141-151.