Thickness monitoring of optical filters for DWDM applications

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dc.contributor.authorPostava, Kamil
dc.contributor.authorPištora, Jaromír
dc.contributor.authorKojima, Masashi
dc.contributor.authorKikuchi, Kazuo
dc.contributor.authorEndo, Kazuhiro
dc.contributor.authorYamaguchi, Tomuo
dc.date.accessioned2006-10-26T11:50:08Z
dc.date.available2006-10-26T11:50:08Z
dc.date.issued2003
dc.description.abstractA method for thickness monitoring and turning-point prediction during deposition of narrow band pass optical filters (NBPF) for dense-wavelength-division-multiplexing (DWDM) applications is proposed. The method is based on a recurrent approach, with relative transmittance .tting, and includes partial coherence and monochromator bandpass e.ects. We show that the partial coherence e.ects in thin .lm structures are signi.cant and can not be neglected. The proposed method is applicable for precise thickness monitoring and deposition control of any complex multilayer coating.en
dc.format.extent192397 bytes
dc.format.mimetypeapplication/pdf
dc.identifier.citationOptics Express. 2003, vol. 11, issue 6, p. 610-616.en
dc.identifier.doi10.1364/OE.11.000610
dc.identifier.issn1094-4087
dc.identifier.locationNení ve fondu ÚKen
dc.identifier.urihttp://hdl.handle.net/10084/57431
dc.identifier.wos000181765500014
dc.language.isoenen
dc.publisherOptical Society of Americaen
dc.relation.ispartofseriesOptics Expressen
dc.relation.urihttps://doi.org/10.1364/OE.11.000610en
dc.rights© 2003 Optical Society of America
dc.rightsThis paper was published in Optics Express and is made available as an electronic reprint with the permission of OSA. The paper can be found at the following URL on the OSA website: http://dx.doi.org/10.1364/OE.11.000610. Systematic or multiple reproduction or distribution to multiple locations via electronic or other means is prohibited and is subject to penalties under law.
dc.rights.accessopenAccess
dc.subjectand multiplexers
dc.subjectswitches
dc.subjectcouplers
dc.subjectmultiplexing
dc.subjectcoatings
dc.subjectdeposition and fabrication
dc.subjectfiber optics and optical communications
dc.subjectthin films
dc.titleThickness monitoring of optical filters for DWDM applicationsen
dc.typearticleen
dc.type.versionpublishedVersion

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