Konverze měření obvodů řady CCR z testeru DTS na ETS
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Vysoká škola báňská - Technická univerzita Ostrava
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The bachelor thesis describes the migration of the test solution used in CCR (Constant Current Regulator) integrated circuit family manufacturing process from DTS2 test platform to ETS-300 platform. The reason is to free test capacity on DTS2 platform. The thesis contains analysis of the current solution for DTS2 and the design of the new solution for the ETS-300. The new solution will consist of coding test program, designing application board, load board and probe card.
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CCR, Constant Current Regulator, Tester ETS-300, Tester DTS2, C++, BASIC, unit probe, prober EG2001, silicon wafer with dice