Application of Bernoulli process-based charts to electronic assembly
| dc.contributor.author | Noskievičová, Darja | |
| dc.contributor.author | Jarošová, Eva | |
| dc.contributor.author | Brodecká, Kateřina | |
| dc.date.accessioned | 2016-11-18T08:46:46Z | |
| dc.date.available | 2016-11-18T08:46:46Z | |
| dc.date.issued | 2015 | |
| dc.description.abstract | The application of protective gel, which is a subprocess of the electronic assembly of the exhaust gas recirculation sensor, is a highly capable process with the fraction of nonconforming units as low as 200 ppm. Every unit is inspected immediately after gel application. The conventional Shewhart chart is of no use here, and the approach based on the Bernoulli process is therefore considered. The number of conforming items in a row until the occurrence of first or the r-th nonconforming is determined and CCC-r, CCC-r EWMA, and CCC CUSUM charts are applied. The aim of the control is to detect the process deterioration, and so the one-sided charts are used. So that the charts based on the geometric or negative binomial distribution can be compared, their performance is assessed through the average number of inspected units until a signal (ANOS). Our study confirmed that CCC-r EWMA and CCC CUSUM are able to detect the process shift more quickly than the CCC-r chart. Of the two charts, the first is easier to construct. | cs |
| dc.description.firstpage | art. no. 14 | cs |
| dc.description.source | Web of Science | cs |
| dc.description.volume | 7 | cs |
| dc.format.extent | 835294 bytes | |
| dc.format.mimetype | application/pdf | |
| dc.identifier.citation | International Journal of Engineering Business Management. 2015, vol. 7, art. no. 14. | cs |
| dc.identifier.doi | 10.5772/60758 | |
| dc.identifier.issn | 1847-9790 | |
| dc.identifier.uri | http://hdl.handle.net/10084/116383 | |
| dc.identifier.wos | 000366195300001 | |
| dc.language.iso | en | cs |
| dc.publisher | Intech | cs |
| dc.relation.ispartofseries | International Journal of Engineering Business Management | cs |
| dc.relation.uri | http://dx.doi.org/10.5772/60758 | cs |
| dc.rights | © 2015 Author(s). Licensee InTech. This is an open access article distributed under the terms of the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited. | cs |
| dc.rights.access | openAccess | |
| dc.rights.uri | http://creativecommons.org/licenses/by/3.0/ | cs |
| dc.subject | CCC-r | cs |
| dc.subject | CCC-CUSUM | cs |
| dc.subject | CCC-r EWMA | cs |
| dc.subject | highly capable process | cs |
| dc.subject | ANOS | cs |
| dc.title | Application of Bernoulli process-based charts to electronic assembly | cs |
| dc.type | article | cs |
| dc.type.status | Peer-reviewed | cs |
| dc.type.version | publishedVersion | cs |