Spoof plasmons in corrugated semiconductors

Abstract

We report on a theoretical investigation of the dispersion relation of surface plasmon polaritons (SPPs) on a periodically corrugated semiconductor surface. We assumed Drude’s permittivity model of the semiconductor, which accurately describes the loss of these spoof SPPs. In the THz frequency range, the properties of the dispersion and loss of spoof SPPs on corrugated Si surfaces are studied. A low-loss propagation of spoof SPPs can be achieved by an optimum design of the surface structure. It was found that by increasing the lattice constant or by reducing the groove depth, the investigated structure can provide a low guiding attenuation.