Fraktografie lomových ploch za použití rastrovací elektronové mikroskopie
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Kvapil, Tomáš
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Vysoká škola báňská - Technická univerzita Ostrava
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Abstract
This thesis deals with history and development scanning electron microscope, the description of modern microscope, the principle and the interaction electrons with sample. Next part is focused on qualitative fractography, the description of main morfological and fractographycal methods, the failure mechanism and basic categories of fracture.
Description
Import 26/06/2013
Subject(s)
Scanning electron microscope, secondary electrons, backscattered electrons, X – ray, fractography, fracture