Synchrotron X-ray scattering reveals early-stage crystallinity during the self-assembly of polyaniline nanotubes with rectangular cross-sections

Abstract

The use of synchrotron X-ray diffraction to study the crystallographic structure of nanostructure polyaniline is reported. It is shown to reveal unprecedented crystallographic information, particularly for early-stage self-assembled intermediate structures that are critical to the formation process. We discuss the new peaks, which are enabled here by specific advantages of synchrotron X-rays, including higher resolution diffraction patterns, and lower sample quantity requirements. The findings have application to the study of the structural evolution underpinning PANI nanotube formation.