Analysis of EMC factors on electronic devices using PLS-SEM method: A case study in Vietnam

Abstract

Electronic equipment is indispensable in the industrial 4.0 era. Electromagnetic Compatibility issues with electronic devices are increasingly concerning. The phenomenon of electromagnetic field compatibility is getting higher and higher. The operating quality of electronic equipment is more and more adversely affected, such as by the phenomenon of hesitation in operation for the operating structures, the generation of fire and explosion of electrical equipment, the loss of information, and many other negative effects. This paper discusses the relationship between Electromagnetic Compatibility (EMC) scoring, Electromagnetic Interference (EMI) scoring, and Electromagnetic Susceptibility (EMS) scoring with the performance quality of electronic devices (QUA). We perform reviews on regulatory institutions governing Electromagnetic Compatibility on electronic devices. To evaluate the proposed Electromagnetic Compatibility structure and its relationship to electronic devices, we proposed to use the Partial Least Squares Structural Equation Modeling (PLS-SEM) method. The research results of the model show that the electronic device layout conditions and the lack of systematic conditions have a negative impact on the operating quality of the electronic equipment, while the conditions on equipment techniques, scientific and technological resources have positive and significant impacts.