Teorie a užití optických mikrometrů

Abstract

The presented dissertation thesis contains an essential overview state of the art deviation measurement in a range of millimeters to micrometers. Custom test of selected contactless micrometers to measure object's profile with a circular cross-section is a part of work is. In terms of the dissertation thesis, submit a custom calibration method of a measurement system, which has the main goal of reducing total measurement error. The calibration method compensates mutual position and rotation of shadow micrometers in a plane. The method uses affine transformation and deformation of resulting landmarks. The method's results are optimal overlap of measured data from micrometers with uncertainty closed to use only one micrometer.

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Subject(s)

Data processing, micrometer, affine transformation, calibration, cross-correlation, measurement system

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