Srovnání metod nedestruktivního a destruktivního měření tloušťky elektrolyticky nanášených vrstev

Abstract

This diploma thesis deals with the comparison of methods of non-destructive and destructive measurement of the thickness of electrolytically deposited layers. In the theoretical part, the issues of the work were summarized together with the individual devices and methods that were used during the practical part. Samples provided by ABB with an electrolytically applied silver coating were used for the measurements. There were three samples in total, marked as A, B and C. A hand-held spectrometer and a stationary device and an optical microscope were used for the measurements. For the destructive method, the samples were measured in the software. The measurement time for all samples was set to 10 seconds. Measurement results of the handheld spectrometer at the selected point L: 7.207 ± 0.116 µm. For the destructive method: 7.202 ± 0.202 µm. For a stationary spectrometer: 6.471 ± 0.142 µm. The destructive method confirmed the position of the arithmetic mean of the handheld spectrometer.